Course Name Code Semester T+U Hours Credit ECTS
Surface Analysis Techniques KIM 511 0 3 + 0 3 6
Precondition Courses
Recommended Optional Courses
Course Language Turkish
Course Level yuksek_lisans
Course Type Optional
Course Coordinator Prof.Dr. İLKAY ŞİŞMAN
Course Lecturers Prof.Dr. İLKAY ŞİŞMAN,
Course Assistants
Course Category
Course Objective

The properties of surface atoms are usually different from those of the same atoms in the bulk. It is important to have the means to measure those properties. The surfaces of solids play a remarkably large number of processes, phenomena, and materials of technological importance. These include catalysis, corrosion, adhesion, microelectronics, composites, thin films, and solid surface reactions. In all the above examples, it is necessary to analyze the surface which finally meets the technological requirements for a purposefully changed surface. A wealth of analytical methods is available to the analyst, and the choice of the method appropriate for the solution of his problem requires a basic knowledge on the methods, techniques and procedures of surface and thin-film analysis. Since this reasons, to inform the students about this topic will be beneficial.

Course Content

Introduction, Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES), Static Secondary Ion Mass Spectrometry (SSIMS), Dynamic Secondary Ion Mass Spectrometry (SIMS), X-ray Fluorescence Spectroscopy (XRF), Scanning Electron Microscopy (SEM), Energy-dispersive X-ray Spectroscopy (EDXS), X-ray Diffraction (XRD), Surface-Enhanced Raman Scattering (SERS), Atomic Force Microscopy (AFM), Scanning Tunneling Microscopy (STM), Comparison of Techniques.

# Course Learning Outcomes Teaching Methods Assessment Methods
1 The students understand necessity of surface analysis. Lecture, Discussion, Testing, Homework,
2 The students know application fields of solid surfaces. Lecture, Question-Answer, Testing, Performance Task,
3 The students learn surface analysis techniques. Lecture, Question-Answer, Testing, Homework,
4 The students know about scanning probe microscopy techniques. Lecture, Testing,
5 The students understand X-ray based techniques. Lecture, Testing,
6 The students learn Surface-Enhanced Raman Scattering. Lecture, Testing,
Week Course Topics Preliminary Preparation
1 Introduction Pages 1-5
2 Photoelectron Spectroscopy (XPS) Pages 6-32
3 Auger Electron Spectroscopy (AES) Pages 32-49
4 Static Secondary Ion Mass Spectrometry (SSIMS) Pages 86-105
6 X-ray Fluorescence Spectroscopy (XRF) Pages 181-193
7 Scanning Electron Microscopy (SEM) Pages 194-207
8 Energy-dispersive X-ray Spectroscopy (EDXS) Pages 194-207
10 X-ray Diffraction (XRD) Pages 211-212
11 Surface-Enhanced Raman Scattering (SERS) Pages 254-264
12 Atomic Force Microscopy (AFM) Pages 276-283
13 Scanning Tunneling Microscopy (STM) Pages 284-290
14 Comparison of Techniques Pages 291-294
Course Notes <p>[1] BUBERT, H. and JENETT, H., &ldquo;Surface and Thin Film Analysis: Principles, Instrumentation, Applications&rdquo;, Wiley-VCH Verlag GmbH, 2002.</p>
Course Resources

[1] MILLING, A.J. “Surface Characterization Methods”, Marcel-Dekker, 1999.

[2] BIRDI, K.S., “Scanning Probe Microscopes”, CRC PRESS, 2003.

Order Program Outcomes Level of Contribution
1 2 3 4 5
1 In addition to expanding and making deeper the knowledge established on undergraduate education in a same or different area, reaches the knowledge by doing research and also improves his or her knowledge to the expertise level by doing evaluation and practice. X
2 Utilizing incomplete or limited data in his or her study area expands the knowledge by experimental methods and use those obtained knowledge by scientific, social and ethical responsibility. X
3 - Constructs a problem with his/her adviser and develops a solution method and by evaluating the results apply them if it is necessary in his/ her area. X
4 -Transfer the current developments and his/her studies to the other related or nonrelated groups as written, orally and visually. X
5 - Develops new strategic approach and produces solutions in unexpected and complicated situations in his or her area of practice. X
6 - Develops strategic and practice plans and evaluates the obtained results within the framework of quality process in his or her study area. X
7 - Has written communication ability in one of well known foreign languages (“European Language Portfolio Global Scale”, Level A1).
8 -Has knowledge for software and hardware about computers and uses data processing. X
9 Protecting scientific, social, and ethical values, teaches and controls these values in the steps of collection, evaluation and announcement of data in the international arena. X
10 - Applies his or her digested knowledge and problem solving ability in advanced studies. X
Evaluation System
Semester Studies Contribution Rate
1. Ödev 100
Total 100
1. Yıl İçinin Başarıya 40
1. Final 60
Total 100
ECTS - Workload Activity Quantity Time (Hours) Total Workload (Hours)
Course Duration (Including the exam week: 16x Total course hours) 16 3 48
Hours for off-the-classroom study (Pre-study, practice) 16 3 48
Mid-terms 1 15 15
Assignment 1 10 10
Performance Task (Seminar) 1 10 10
Final examination 1 20 20
Total Workload 151
Total Workload / 25 (Hours) 6.04
dersAKTSKredisi 6